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Name
Vaz, F.
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Results 1-9 of 9 (Search time: 0.004 seconds).
Issue Date | Title | Author(s) | Type | Access | |
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1 | 2000 | Characterisation of Ti1-xSixNy nanocomposite films | Vaz, F. ; Rebouta, L. ; Goudeau, P. ; Pacaud, J. ; Garem, H. ; Rivière, J. P. ; Cavaleiro, A. ; Alves, E. | article | openAccess |
2 | 2003 | Effects of the morphology and structure on the elastic behavior of (Ti,Si,Al)N nanocomposites | Carvalho, S. ; Ribeiro, E. ; Rebouta, L. ; Vaz, F. ; Alves, E. ; Schneider, D. ; Cavaleiro, A. | article | openAccess |
3 | 2001 | Elastic properties of (Ti,Al,Si)N nanocomposite films | Carvalho, S. ; Vaz, F. ; Rebouta, L. ; Schneider, D. ; Cavaleiro, A. ; Alves, E. | article | openAccess |
4 | 2007 | Influence of the O/C ratio in the behaviour of TiCxOy thin films | Fernandes, A. C. ; Vaz, F. ; Rebouta, L. ; Pinto, A. ; Alves, E. ; Parreira, N. M. G. ; Goudeau, Ph. ; Bourhis, E. Le ; Rivière, J. P. | article | openAccess |
5 | 1998 | Physical and mechanical properties of Ti1 - xSixN films | Vaz, F. ; Rebouta, L. ; Ramos, S. ; Cavaleiro, A. ; Silva, M. F. da ; Soares, J. C. | article | openAccess |
6 | 1998 | Physical, structural and mechanical characterization of Ti1-xSixNy films | Vaz, F. ; Rebouta, L. ; Ramos, S. ; Silva, M. F. da ; Soares, J. C. | article | openAccess |
7 | 2004 | Property change in ZrNxOy thin films: effect of the oxygen fraction and bias voltage | Vaz, F. ; Carvalho, P. ; Cunha, L. ; Rebouta, L. ; Moura, C. ; Alves, E. ; Ramos, A. R. ; Cavaleiro, A. ; Goudeau, Ph. ; Rivière, J. P. | article | openAccess |
8 | 2006 | Structural evolution in ZrNxOy thin films as a function of temperature | Cunha, L. ; Vaz, F. ; Moura, C. ; Rebouta, L. ; Carvalho, P. ; Alves, E. ; Cavaleiro, A. ; Goudeau, Ph. ; Rivière, J. P. | article | openAccess |
9 | 2005 | Structural stability of decorative ZrNxOy thin films | Carvalho, P. ; Vaz, F. ; Rebouta, L. ; Carvalho, S. ; Cunha, L. ; Goudeau, Ph. ; Rivière, J. P. ; Alves, E. ; Cavaleiro, A. | article | openAccess |