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Issue DateTitleAuthor(s)TypeAccess
12005Structural stability of decorative ZrNxOy thin filmsCarvalho, P. ; Vaz, F. ; Rebouta, L. ; Carvalho, S. ; Cunha, L. ; Goudeau, Ph. ; Rivière, J. P. ; Alves, E. ; Cavaleiro, A. articleopenAccess
22006Structural evolution in ZrNxOy thin films as a function of temperatureCunha, L. ; Vaz, F. ; Moura, C. ; Rebouta, L. ; Carvalho, P. ; Alves, E. ; Cavaleiro, A. ; Goudeau, Ph. ; Rivière, J. P. articleopenAccess
32007The influence of structure changes in the properties of TiCxOy decorative thin filmsFernandes, A. C. ; Vaz, F. ; Cunha, L. ; Parreira, N. M. G. ; Cavaleiro, A. ; Goudeau, Ph. ; Bourhis, E. Le ; Rivière, J. P. ; Munteanu, D. ; Borcea, B. ; Cozma, R. articleopenAccess
42004Property change in ZrNxOy thin films: effect of the oxygen fraction and bias voltageVaz, F. ; Carvalho, P. ; Cunha, L. ; Rebouta, L. ; Moura, C. ; Alves, E. ; Ramos, A. R. ; Cavaleiro, A. ; Goudeau, Ph. ; Rivière, J. P. articleopenAccess