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| Issue Date | Title | Author(s) | Type | Access | |
|---|---|---|---|---|---|
| 1 | 2000 | Characterisation of Ti1-xSixNy nanocomposite films | Vaz, F. ; Rebouta, L. ; Goudeau, P. ; Pacaud, J. ; Garem, H. ; Rivière, J. P. ; Cavaleiro, A. ; Alves, E. | article | openAccess |
| 2 | 2000 | A structural and mechanical analysis on PVD-grown (Ti,Al)N/Mo multilayers | Tavares, C. J. ; Rebouta, L. ; Alves, E. ; Cavaleiro, A. ; Goudeau, P. ; Rivière, J. P. ; Declemy, A. | article | openAccess |
| 3 | 2005 | Structural stability of decorative ZrNxOy thin films | Carvalho, P. ; Vaz, F. ; Rebouta, L. ; Carvalho, S. ; Cunha, L. ; Goudeau, Ph. ; Rivière, J. P. ; Alves, E. ; Cavaleiro, A. | article | openAccess |
| 4 | 2006 | Structural evolution in ZrNxOy thin films as a function of temperature | Cunha, L. ; Vaz, F. ; Moura, C. ; Rebouta, L. ; Carvalho, P. ; Alves, E. ; Cavaleiro, A. ; Goudeau, Ph. ; Rivière, J. P. | article | openAccess |
| 5 | 2007 | The influence of structure changes in the properties of TiCxOy decorative thin films | Fernandes, A. C. ; Vaz, F. ; Cunha, L. ; Parreira, N. M. G. ; Cavaleiro, A. ; Goudeau, Ph. ; Bourhis, E. Le ; Rivière, J. P. ; Munteanu, D. ; Borcea, B. ; Cozma, R. | article | openAccess |
| 6 | 2004 | Property change in ZrNxOy thin films: effect of the oxygen fraction and bias voltage | Vaz, F. ; Carvalho, P. ; Cunha, L. ; Rebouta, L. ; Moura, C. ; Alves, E. ; Ramos, A. R. ; Cavaleiro, A. ; Goudeau, Ph. ; Rivière, J. P. | article | openAccess |