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|Title:||Single overloads FCG modeling considering damage accumulation||Authors:||Sérgio, E. R.
Borges, M. F. M.
Neto, D. M.
Antunes, F. V.
Pais, J. P.
|Serial title, monograph or event:||Procedia Structural Integrity||Volume:||33||Abstract:||In this study, Fatigue Crack Growth (FCG) in a CT specimen, submitted to single overloads, is predicted by a node release numerical model, which considers the plastic strain to be the main FCG driving force. The Gauss-Tvergaard-Needleman (GTN) damage model was implemented to account for the, inevitable, growth and nucleation of microvoids in the occurrence of high levels of plastic strain. Crack closure shown to be a crucial mechanism influencing the differences between both models, as well as it explains the effects of the overloads on the FCG rate.||URI:||http://hdl.handle.net/10316/101066||ISSN:||24523216||DOI:||10.1016/j.prostr.2021.10.113||Rights:||openAccess|
|Appears in Collections:||I&D CEMMPRE - Artigos em Revistas Internacionais|
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