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|Title:||Effect of Nb5+ and In3+ Ions on Moisture Sensitivity of Electrospun Titanium/Tungsten Oxide Nanostructures: Microstructural Characterization and Electrical Response||Authors:||Silva, Georgenes M. G.
Leão, Victor N. S.
Pereira, Michel F. G.
Faia, Pedro M.
Araújo, Evando S.
|Keywords:||characterization; preparation; electrospinning; mixed metal oxide; nanostructures||Issue Date:||2021||Project:||Brazil - Fundação de Amparo à Pesquisa do Estado da Bahia (FAPESB)
Brazil - Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
Brazil - Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
|Serial title, monograph or event:||Processes||Volume:||9||Issue:||8||Abstract:||In this work, Nb5+ and In3+ ions were used as dopants in titanium/tungsten oxide nanostructures that are produced by the electrospinning and sintering process, for relative humidity (RH) detection. The microstructural properties were investigated by SEM, EDS, XRD, Raman and FTIR techniques. The electrical response characterization of the samples was performed by electrical impedance spectroscopy in the range of 400 Hz to 40 MHz, at 20◦C. The sensors sensitivity to moisture was evaluated in terms of the impedance variations to RH (10–100%). The combined analysis of the microstructural characterization results confirmed the surface interaction between the oxides and the ions incorporation in Ti crystal lattice. All the studied sensors showed a conduction transition from p-to n-type at around 30–40% RH: besides, they also displayed better sensitivity to moisture than those obtained in a previous work using titanium/tungsten combination using a different fabricationn route. The impedance modulus variation up to 1.1 and 1.3 orders of magnitude for the 4 wt % niobium and indium doped samples, respectively. The results are directly associated with the microstructure and alternative preparation process.||URI:||http://hdl.handle.net/10316/100849||ISSN:||2227-9717||DOI:||10.3390/pr9081336||Rights:||openAccess|
|Appears in Collections:||I&D CEMMPRE - Artigos em Revistas Internacionais|
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