Please use this identifier to cite or link to this item:
https://hdl.handle.net/10316/3800
Title: | Paper superficial waviness: Conception and implementation of an industrial statistical measurement system | Authors: | Costa, Raquel Angélico, Dina Reis, Marco S. Ataíde, José M. Saraiva, Pedro M. |
Keywords: | Paper superficial waviness; Measurement system; Product design; Process quality control | Issue Date: | 2005 | Citation: | Analytica Chimica Acta. 544:1-2 (2005) 135-142 | Abstract: | The development of proper measurement methodologies for product evaluation is a critical issue to papermakers since their customers are increasingly demanding in regard to new product development and product quality. | URI: | https://hdl.handle.net/10316/3800 | DOI: | 10.1016/j.aca.2005.02.027 | Rights: | openAccess |
Appears in Collections: | FCTUC Eng.Química - Artigos em Revistas Internacionais |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
filed5e3e4695b004c85827da2b8ee7c29ac.pdf | 212.8 kB | Adobe PDF | View/Open |
SCOPUSTM
Citations
17
checked on Sep 9, 2024
WEB OF SCIENCETM
Citations
13
checked on Sep 2, 2024
Page view(s) 20
640
checked on Sep 10, 2024
Download(s)
369
checked on Sep 10, 2024
Google ScholarTM
Check
Altmetric
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.