Please use this identifier to cite or link to this item: http://hdl.handle.net/10316/10339
Title: Atomic Force Microscopy of DNA Immobilized onto a Highly Oriented Pyrolytic Graphite Electrode Surface
Authors: Brett, Ana Maria Oliveira 
Paquim, Ana Maria Chiorcea 
Issue Date: 29-Apr-2003
Publisher: American Chemical Society
Citation: Langmuir. 19:9 (2003) 3830-3839
Abstract: Magnetic AC mode atomic force microscopy (MAC Mode AFM) was used to characterize the process of adsorption of DNA on a highly oriented pyrolytic graphite (HOPG) electrode surface using different concentrations of DNA and adsorption procedures. AFM of DNA immobilized on the HOPG showed that both single-stranded DNA and double-stranded DNA molecules have the tendency to spontaneously self-assemble from solution onto the solid support and the process was very fast. DNA condensed on the substrate in a tight and well-spread two-dimensional lattice covering the entire surface uniformly. The interaction of DNA with the hydrophobic HOPG surface induced DNA superposition, overlapping, and intra- and intermolecular interactions. The application of a positive potential of 300 mV (vs Ag wire) to the HOPG electrode during adsorption was studied. The applied potential considerably enhanced the robustness and stability to mechanical stress of the DNA films, through multiple electrostatic interactions between the negatively charged hydrophilic sugar−phosphate backbone and the positively charged carbon surface. The characteristics of the DNA films and the apparent height of the network wires were dependent on the DNA concentration and the immobilization procedure. The DNA lattices were held together on the substrate surface only by noncovalent interactions such as hydrogen bonding, base stacking, electrostatic, van der Waals, and hydrophobic interactions.
URI: http://hdl.handle.net/10316/10339
ISSN: 0743-7463
DOI: 10.1021/la027047d
Rights: openAccess
Appears in Collections:FCTUC Química - Artigos em Revistas Internacionais

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