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| Issue Date | Title | Author(s) | Type | Access | |
|---|---|---|---|---|---|
| 1 | 2004 | Property change in ZrNxOy thin films: effect of the oxygen fraction and bias voltage | Vaz, F. ; Carvalho, P. ; Cunha, L. ; Rebouta, L. ; Moura, C. ; Alves, E. ; Ramos, A. R. ; Cavaleiro, A. ; Goudeau, Ph. ; Rivière, J. P. | article | openAccess |