Please use this identifier to cite or link to this item:
https://hdl.handle.net/10316/8282
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Pauliukaite, Rasa | - |
dc.contributor.author | Brett, Christopher M. A. | - |
dc.date.accessioned | 2009-02-09T14:31:30Z | - |
dc.date.available | 2009-02-09T14:31:30Z | - |
dc.date.issued | 2005 | en_US |
dc.identifier.citation | Electroanalysis. 17:15-16 (2005) 1354-1359 | en_US |
dc.identifier.uri | https://hdl.handle.net/10316/8282 | - |
dc.description.abstract | Bismuth film electrodes, formed by electrochemical deposition on carbon film resistor electrode substrates at constant applied potential, by potential cycling or at constant applied current have been investigated for the first time. The electrochemical behaviour of the films was characterised by cyclic voltammetry and electrochemical impedance spectroscopy and they were applied to the determination of Zn, Cd, and Pb by square-wave anodic stripping voltammetry. The highest sensitivities coupled with nanomolar detection limits were achieved at bismuth films formed at constant potential; however, in situ deposited bismuth films exhibited better reproducibility. Future application as small, short-term-use sensors is indicated. | en_US |
dc.language.iso | eng | eng |
dc.rights | openAccess | eng |
dc.title | Characterization and Application of Bismuth-Film Modified Carbon Film Electrodes | en_US |
dc.type | article | en_US |
dc.identifier.doi | 10.1002/elan.200403282 | en_US |
item.openairetype | article | - |
item.languageiso639-1 | en | - |
item.openairecristype | http://purl.org/coar/resource_type/c_18cf | - |
item.cerifentitytype | Publications | - |
item.grantfulltext | open | - |
item.fulltext | Com Texto completo | - |
crisitem.author.orcid | 0000-0002-1972-4434 | - |
Appears in Collections: | FCTUC Química - Artigos em Revistas Internacionais |
SCOPUSTM
Citations
106
checked on Mar 18, 2024
WEB OF SCIENCETM
Citations
1
102
checked on Mar 2, 2024
Page view(s)
363
checked on Mar 26, 2024
Download(s)
350
checked on Mar 26, 2024
Google ScholarTM
Check
Altmetric
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.