Please use this identifier to cite or link to this item:
https://hdl.handle.net/10316/4305
Title: | A methodology development for the study of near surface stress gradients | Authors: | Marques, M. J. Dias, A. M. Gergaud, P. Lebrun, J. L. |
Keywords: | Grazing incidence X-ray diffraction; Residual stress gradients; PVD chromium film | Issue Date: | 2000 | Citation: | Materials Science and Engineering A. 287:1 (2000) 78-86 | Abstract: | A modification of the geometry used in the sin2 [psi] technique of X-ray diffraction is described. A modified equation for residual stress determination, including geometric adapted Fij, is presented. This method allows near surface stress gradients determination and is called pseudo-grazing incidence method. The limits of the new technique were first tested on different powder materials with X-ray radiation produced by conventional tubes and by a synchrotron radiation source. The technique was finally applied for the determination of a residual stress profile in a polished molybdenum surface before and after the deposition of a PVD chromium film. | URI: | https://hdl.handle.net/10316/4305 | DOI: | 10.1016/S0921-5093(00)00819-4 | Rights: | openAccess |
Appears in Collections: | FCTUC Eng.Mecânica - Artigos em Revistas Internacionais |
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