Please use this identifier to cite or link to this item: https://hdl.handle.net/10316/109400
Title: Market Efficiency, Roughness and Long Memory in PSI20 Index Returns: Wavelet and Entropy Analysis
Authors: Pascoal, Rui 
Monteiro, Ana Margarida 
Keywords: efficiency; long memory; fractal dimension; unpredictability; q-triplet; entropy; wavelets
Issue Date: 2014
Publisher: MDPI
Serial title, monograph or event: Entropy
Volume: 16
Issue: 5
Abstract: In this study, features of the financial returns of the PSI20index, related to market efficiency, are captured using wavelet- and entropy-based techniques. This characterization includes the following points. First, the detection of long memory, associated with low frequencies, and a global measure of the time series: the Hurst exponent estimated by several methods, including wavelets. Second, the degree of roughness, or regularity variation, associated with the H¨older exponent, fractal dimension and estimation based on the multifractal spectrum. Finally, the degree of the unpredictability of the series, estimated by approximate entropy. These aspects may also be studied through the concepts of non-extensive entropy and distribution using, for instance, the Tsallis q-triplet. They allow one to study the existence of efficiency in the financial market. On the other hand, the study of local roughness is performed by considering wavelet leader-based entropy. In fact, the wavelet coefficients are computed from a multiresolution analysis, and the wavelet leaders are defined by the local suprema of these coefficients, near the point that we are considering. The resulting entropy is more accurate in that detection than the H¨older exponent. These procedures enhance the capacity to identify the occurrence of financial crashes.
URI: https://hdl.handle.net/10316/109400
ISSN: 1099-4300
DOI: 10.3390/e16052768
Rights: openAccess
Appears in Collections:FEUC- Artigos em Revistas Internacionais

Show full item record

Page view(s)

46
checked on Apr 24, 2024

Download(s)

26
checked on Apr 24, 2024

Google ScholarTM

Check

Altmetric

Altmetric


This item is licensed under a Creative Commons License Creative Commons