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Title: Angle-scanned photoemission: Fermi surface mapping and structural determination
Authors: Aebi, P. 
Fasel, R. 
Naumovic, D. 
Hayoz, J. 
Pillo, Th. 
Bovet, M. 
Agostino, R. G. 
Patthey, L. 
Schlapbach, L. 
Gil, F. P. 
Berger, H. 
Kreutz, T. J. 
Osterwalder, J. 
Keywords: Angle-scanned photoemission; Band mapping; Fermi surface mapping; Photoelectron diffraction; Surface structure
Issue Date: 1998
Citation: Surface Science. 402-404:(1998) 614-622
Abstract: A brief survey of the angle-scanned photoemission technique is given. It incorporates two complementary methods in one:
Rights: openAccess
Appears in Collections:FCTUC Física - Artigos em Revistas Internacionais

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