Please use this identifier to cite or link to this item:
https://hdl.handle.net/10316/4359| Title: | Measuring the angular profile of the reflection of xenon scintillation light | Authors: | Silva, C.P. Pinto da Cunha, J. Chepel, V. Pereira, A. Solovov, V. Mendes, P. Neves, F. Lopes, M.I. |
Keywords: | Reflectance; Xenon scintillation; Liquid xenon | Issue Date: | 2007 | Citation: | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 580:1 (2007) 322-325 | Abstract: | A chamber designed for measuring the angular distribution of reflected ultraviolet vacuum light is described. We report first measurements of the reflection profile of xenon scintillation light by a polished copper surface and by polytetrafluoroethylene (PTFE). | URI: | https://hdl.handle.net/10316/4359 | DOI: | 10.1016/j.nima.2007.05.166 | Rights: | openAccess |
| Appears in Collections: | FCTUC Física - Artigos em Revistas Internacionais |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| filee6839fe99860428884bf9765ebb8cc5f.pdf | 173.27 kB | Adobe PDF | View/Open |
SCOPUSTM
Citations
8
checked on Apr 15, 2024
WEB OF SCIENCETM
Citations
9
checked on Sep 2, 2023
Page view(s)
287
checked on Apr 16, 2024
Download(s)
301
checked on Apr 16, 2024
Google ScholarTM
Check
Altmetric
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.