Please use this identifier to cite or link to this item: http://hdl.handle.net/10316/4235
Title: Determination of the sp3 C content of a-C films through EELS analysis in the TEM
Authors: Galvan, D. 
Pei, Y. T. 
Hosson, J. Th. M. De 
Cavaleiro, A. 
Keywords: sp3/sp2
Issue Date: 2005
Citation: Surface and Coatings Technology. 200:1-4 (2005) 739-743
Abstract: Electron energy loss spectroscopy (EELS) in a transmission electron microscope (TEM) was employed to estimate the sp3 C content in magnetron sputtered H-free a-C coatings. The deconvolution procedure developed reduces considerably the error which is due to beam point spread function and sample thickness. The methodology has been applied to thin a-C films deposited through RF magnetron sputtering, and determined that, under the present values of ion current to the substrates (< 1 mA/cm2), a variation in energy of the upcoming ions (achieved through a variation in applied substrate bias) has a negligible influence on the C atoms hybridization.
URI: http://hdl.handle.net/10316/4235
Rights: openAccess
Appears in Collections:FCTUC Eng.Mecânica - Artigos em Revistas Internacionais

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