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Full Name
Carvalho, C. Nunes de
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Issue DateTitleAuthor(s)TypeAccess
12007Positron annihilation and constant photocurrent method measurements on a-Si:H films: A comparative approach to defect identificationGordo, P. M. ; Marques, M. F. Ferreira ; Gil, C. Lopes ; Lima, A. P. de ; Lavareda, G. ; Carvalho, C. Nunes de ; Amaral, A. ; Kajcsos, Zs. articleopenAccess