Browsing by Author Rebouta, L.
Results 6 to 15 of 15
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Issue Date | Title | Author(s) | Type | Access |
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2001 | Mechanical and surface analysis of Ti0.4Al0.6N/Mo multilayers | Tavares, C. J. ; Rebouta, L. ; Andritschky, M. ; Guimarães, F. ; Cavaleiro, A. | article | openAccess |
1999 | Mechanical characterisation of TiN/ZrN multi-layered coatings | Tavares, C. J. ; Rebouta, L. ; Andritschky, M. ; Ramos, S. | article | openAccess |
2001 | Microstructure and mechanical properties of nanocomposite (Ti,Si,Al)N coatings | Carvalho, S. ; Rebouta, L. ; Cavaleiro, A. ; Rocha, L. A. ; Gomes, J. ; Alves, E. | article | openAccess |
2004 | Microstructure, mechanical properties and cutting performance of superhard (Ti,Si,Al)N nanocomposite films grown by d.c. reactive magnetron sputtering | Carvalho, S. ; Ribeiro, E. ; Rebouta, L. ; Tavares, C. ; Mendonça, J. P. ; Monteiro, A. Caetano ; Carvalho, N. J. M. ; Hosson, J. Th. M. De ; Cavaleiro, A. | article | openAccess |
1998 | Physical and mechanical properties of Ti1 - xSixN films | Vaz, F. ; Rebouta, L. ; Ramos, S. ; Cavaleiro, A. ; Silva, M. F. da ; Soares, J. C. | article | openAccess |
1998 | Physical, structural and mechanical characterization of Ti1-xSixNy films | Vaz, F. ; Rebouta, L. ; Ramos, S. ; Silva, M. F. da ; Soares, J. C. | article | openAccess |
2004 | Property change in ZrNxOy thin films: effect of the oxygen fraction and bias voltage | Vaz, F. ; Carvalho, P. ; Cunha, L. ; Rebouta, L. ; Moura, C. ; Alves, E. ; Ramos, A. R. ; Cavaleiro, A. ; Goudeau, Ph. ; Rivière, J. P. | article | openAccess |
2000 | A structural and mechanical analysis on PVD-grown (Ti,Al)N/Mo multilayers | Tavares, C. J. ; Rebouta, L. ; Alves, E. ; Cavaleiro, A. ; Goudeau, P. ; Rivière, J. P. ; Declemy, A. | article | openAccess |
2006 | Structural evolution in ZrNxOy thin films as a function of temperature | Cunha, L. ; Vaz, F. ; Moura, C. ; Rebouta, L. ; Carvalho, P. ; Alves, E. ; Cavaleiro, A. ; Goudeau, Ph. ; Rivière, J. P. | article | openAccess |
2005 | Structural stability of decorative ZrNxOy thin films | Carvalho, P. ; Vaz, F. ; Rebouta, L. ; Carvalho, S. ; Cunha, L. ; Goudeau, Ph. ; Rivière, J. P. ; Alves, E. ; Cavaleiro, A. | article | openAccess |